ELECTRON BACKSCATTER DIFFRACTION (EBSD)
The MES Surface Characterization lab provides Electron Backscatter Diffraction (EBSD) to characterize crystallographic properties of metal samples and thin films. Proprieties that can be determined by this technique include: grain size, grain shape, grain orientation, grain boundary orientation, spatial distribution of phases, local deformation, and texture.
EBSD can be combined with Scanning Electron Microscopy, WDS, EDS or X-ray diffraction (XRD) services to provide a complete picture of your materials.
MES provides rapid inspection results at an affordable price. As an A2LA ISO 17025 accredited service provider, quality is our focus.
Texture Analysis in exact locations
Visualization of microstructure with spatial coordinates
Grain Size and Orientation Analysis
Grain Boundary Analysis
Highly polished flat surface